Description of the functions of the I2IS-1.dll library
The dll includes 20 tests for measuring the parameters of the IC-1 integrated circuit:
Test00 - Contact test
Test01 - Measurement of current consumption Icons. IDD1-A
Test02 - Measurement of current consumption Icons. IDD1-I
Test03 - Measurement of current consumption Icons. IDD2-A
Test04 - Measurement of current consumption Icons. IDD2-B
Test05 - Measurement of output voltage low level UOL21
Test06 - Measurement of output voltage low level UOL22
Test07 - Measurement of output voltage high level UOH21
Test08 - Measurement of output voltage high level UOH22
Test09 - Measurement of high level voltage at pin B of UOH1-B
Test10 - Measuring high level voltage at pin A of UOH1-A
Test11 - Measurement of low level output voltage at pin B of UOL1-B
Test12 - Measurement of the low level output voltage at pin A UOL1A
Test13 - Measurement of the input low level current of the low-voltage part IIL
Test14 - Measurement of the input high level current of the low voltage part IIH
Test15 - Monitoring the functioning of Uout_B
Test16 - Monitoring the functioning of Uout_A
Test17 - Monitoring the functioning of high-voltage outputs Uout_Q
Test18 - Monitoring the functioning of high-voltage outputs Uout_Q
Test19 - Monitoring the functioning of high-voltage outputs Uout_Q
The ini file with a description of the parameters for the IC IS-1, based on it, a description will be made for the test functions in the dll below. For example, the description of the input parameters will be given for test 05.
The input parameter for the test is a float array ArrayIn.
The first element of the array is the test operation mode: 0 - "All measurements" (measures all test parameters without taking into account scrap), 1 - "Up to 1 scrap" (stop passing the test when the first rejected parameter appears, subsequent parameters are not measured, but in the resulting array ArrayOut displays "nan" for each output parameter).
Array elements 2 to 10 are the "regimparam" values from the ini-file (for test 05), which represent the parameters of the power supply operating mode. The order of parameters for a test is set when it is generated. Editing the order of parameters, as well as the test itself, is allowed only by the developers of the test. The value of the parameters is allowed to change in the appropriate range, predetermined by both the developers of the test and the designers of the corresponding IC.
For IC IS-1, the following 4 parameters of the ini-file of test 05 (the number of UDD2 values differs for each specific test) determine the correct operation when measuring parameters - voltage UDD1 (low) and three voltages UDD2 (high). The value of voltages UDD1 and UDD2 are set by two values - the upper and lower boundaries (array elements 11 and 12 - for UDD1; elements 13 to 18 - UDD2). Parameters UDD1, UDD2 - not standardized by NTD, (determined by the supply voltage of the low and high sides of the IC). If, when power is applied to the IC at the beginning of the test, the measured voltage values UDD1 and UDD2 do not correspond to the permissible limits, the test ends without further measurement of the normalized parameters with the final result - "Rejection" (and in this case, the "All measurements" operating mode does not allow further passage test), and the elements of the ArrayOut array get "nan" values. If the voltage values are within the specified limits, the measurement process begins with the output of the results to the output array ArrayOut.
Next, the value of the limits (first the lower, then the upper) of the normalized parameters are indicated. Since the limits for the parameters for one test are the same (for example, for test 05 the values of the limits for UOL21.1 - UOL21.40: lower: -0.3, upper: 17.6), then only one limit is indicated - element 19 of the ArrayIn array: -0.3; element 20 of ArrayIn: 17.6. If there are more limits, they are specified in the ArrayIn array in order according to the ini file.
For the analysis of IC, the results obtained must fit into the specified range of values. If all parameters are in the range of the IC, it is considered valid as a result of the testing carried out, but if at least one result does not fit into the range, it is considered rejected.